Research is heating up to achieve greater fundamental understanding of the mechanism of ferroelectricity in hafnia-based materials, a crucial step in the development of next generation devices. New findings from the University of Groningen (RUG) in the journal Science define the key role of oxygen for greater miniaturization potential and structural stability beyond that of standard ferroelectric materials used in low-power memories. Electron microscopy and MAX IV’s NanoMAX beamline have illuminated the nature of polarization in thin films of hafnium zirconium oxide for ferroelectronics.
To capture extraordinary nanoscale details in crystallography takes the powerful coherent flux of a 4th generation light source. Recent work in Light: Science & Applications by an international research team has revealed 3D images of a complex crystalline star structure using Bragg ptychography and new advanced analysis tools at MAX IV’s NanoMAX beamline. The results demonstrate the possibility of unprecedented data quality beyond experimental limitations from new synchrotron sources.
By growing superlattices consisting of ferroelectric and non-ferroelectric transition metal oxides and releasing them from their underlying substrates, researchers explore polarization patterns in curved geometries.
Researchers at MAX IV measured echoes produced by silicon crystals using the coherent X-ray based technique, tele-ptychography, at NanoMAX imaging beamline. Their findings reveal that strain can be used to tune the time delay of echoes, an important step for tailoring ultrafast X-ray optics.