The multimodal in-situ XAS-XRD endstation is used for in-situ / in-operando investigations with a total time resolution of currently about 20s. Exemplary data is shown here:

Diffraction rings obtained from LaB6 with 1s exposure time.

In-situ data from the formation of metal halide perovskite thin-films (in-FORM project)

Overview over X-ray diffraction patterns acquired during formation of FAPbI3 from solution, recorded at 13595 eV. Integration time for single pattern: 100ms
Extracted single diffraction patterns for specific states within the process, recorded at 13595 eV. Integration time for single pattern: 100ms