…the APRES study of NdNiO3 (NNO) films revealed that substrate-induced strain tunes the crystal field splitting while altering the Fermi Surface (FS) properties and the Metal-Insulator Transition (MIT) temperature. Furthermore,…
…combined with theoretical modelling of the studied ALD processes. Topology of Ultra Thin Metal Films on Semiconductors chevron_right Project title: Topology of Ultra Thin Metal Films on Semiconductors PRISMAS Research…
…contributes to the oxide film. The use of synchrotron X-rays for studying surfaces and thin films of applied materials has robust, beneficial aspects. “The main benefits of synchrotron radiation are…
…material properties to be enhanced, or even wholly new properties to be induced, by manipulating the lattice. Conventionally, strain is induced by growing a thin film or a multilayer on…
With the rise of time-resolved macromolecular crystallography, and to reap the full potential of 4th generation synchrotron source like MAX IV, the team aimed to work out a setup that…
…spectroscopy (APXPS), hard X-ray photoelectron emission spectroscopy (HAXPES), and hard X-ray photoelectron emission microscopy (HAXPEEM), the research team is studying the nature of the passive films that form spontaneously on…
…high-resolution transmission electron microscope (TEM) at RUG and application of voltage, they expected to see a change in polarization, with slight oxygen displacement in the hafnia layer. What they directly…
…Growth of thin films Synthesis of 2D- and nanomaterials Impurities and defects The most popular classes of materials studied by NEXAFS spectroscopy are: Solar cells, batteries and other energy-harvesting and…
…heated to high temperature by an electrical current. Owning to the high reactivity of the metal, the deposited film can capture molecules from the vacuum volume, thus transforming the walls…
…the very thin film of electrolyte on the sample surface. The Ambient Pressure X-ray Photoelectron Spectroscopy (AP-XPS) was applied to observe chemical changes at the steel surface in contact with…