User information AFM
…max 90×90 micrometers with max 5 micrometer total height difference. The lateral resolution for 90 micrometer FOV is better than 50 nm, for 10 micrometer scan – better than 2…
…max 90×90 micrometers with max 5 micrometer total height difference. The lateral resolution for 90 micrometer FOV is better than 50 nm, for 10 micrometer scan – better than 2…
General information Microscopy support labs at MAX IV gather three different machines: a scanning tunneling microscope, an atomic force (scanning) microscope and a scanning electron microscope, as a user support…
…to meet the increased global market demand for more sustainable packaging solutions, new materials based on paper can bring novel opportunities. Yet, these new, paper-based materials must remain food safe,…
…MAX IV general user program. Join the DanMAX User (Google) Group to join the discussions about e.g. data treatment, beamline developments, experimental ideas etc.: Join here! Funders of DanMAX https://www.youtube.com/watch?v=MTnCbhK1Hoc…
…questions, the group constructed a model system consisting of two electrodes and a middle layer of hafnium zirconium oxide. Nukala and Majid Ahmadi, an expert with in situ TEM technique,…
…Use an interactive node to run Xia2: Open a terminal in the thinlinc client, eg, from the Applications -> System Tools menu and load the DIALS module: interactive –exclusive -t…
…University’s Interdisciplinary Nanoscience Center. https://www.youtube.com/watch?v=hgn2XEv2zJM Mantis shrimp experiment, Aarhus University. Credit: MAX IV Laboratory The team of scientists used DanMAX beamline, X-ray fluorescence, and scattered beam measurements to study samples…
…oxidation state of the studied atom. The characteristic “fingerprint” of the coordination around the atom is very important in speciation of different ligands to the studied atom. The pre-edge peak…
…how to apply for the fast access, please visit https://www.maxiv.lu.se/user-access/access-modes/fast-access/ Scanning probe microscopy If your experiment would benefit from UHV scanning probe microscopy (STM or NC-AFM) of your surfaces, samples from…
…laboratories, however, the limited flux, spectral purity and focusing ability of a lab-source severely limits the size and quality of the crystals that can be measured. Moreover, many materials do…