Microscope
…of this image. Right panel: height profile along the indicated line. Comparison between STM and ncAFM imaging/resolution Sample: SiC(0001), STM: Vbias = +1.25 V, It = 230 pA AFM: Vbias…
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Workshop: Industrial utilisation of MAX IV
…materials research as part of a recently completed project funded by Vetenskapsrådet (DNR: 2018-06378). The project has focused on tackling challenges that limit the industrial use of these types of…
Amorphous atomic structure of tungsten oxide detected at DanMAX
…atomic structure compared to bulk versions of the same material. The research reported the first observation that nanosizing a material can make the atomic structure go from crystalline to amorphous. …
Zigzag graphene nanoribbons’ surface state hints at spin-polarized channels’ potential practical applications
…discovered that while the zigzag graphene nanoribbon monolayer sank almost completely into a silicon carbide facet, its lower edge dissolved and mixed with the silicon carbide substrate. The researchers highlighted…