Beamline optics

The basic optical design for the beamline includes a silicon 111 horizontally deflecting double crystal monochromator (hDCM) followed by two pairs of mechanically bendable flat mirrors in Kirkpatrick-Baez (KB) configuration…

Sample Environments

…endstation. Some other beamlines around the world use the same sample pins. We offer flat versions with either a 4×4 mm or a 5×5 mm mounting area. There are also…

Beamline optics

…pair (VFM, HFM) Vertical focusing mirror (VFM) At 31.5 m, 3 mrad grazing incidence angle Flat substrate bent to an elliptical cylinder: 0.148 μrad RMS slope error over 200 mm,…

User information

…plates, both the regular flat type and the built up ‘direct heating’ type. We keep a large stock of copper and aluminium flat plates for experiments that do not involve…

Sample Delivery Systems

…delivery system) and more are under development (liquid flat jet setup – monitor this page for more details). Molecular jet source / Cluster source This sample delivery system delivers a continuous beam…

Photoluminescence end station

…spectroscopy experiments examining the reflection signal from flat samples’ surfaces as well as detecting the transmitted light passing through the samples studied. Advanced experiments which include a combination of synchrotron…

Sample holders

…pins for the use with samples intended for tomographic measurements, as well as flat framed holders for 2D imaging applications. Currently the pins can be offered either made from Aluminium…

Technical Notes

R3 beam dynamics High-Chromaticity_Optics_for_the_MAX_IV_3_GeV_Storage_Ring.pdf Internal_Note_20090902_Updated_Lattice_120614.pdf Internal_Note_20100318_Updated_Lattice_120614.pdf Internal_Note_20100512_Pulsed_Magnet_Injection_120612.pdf Internal_Note_20101101_Updated_Lattice_120614.pdf Internal_Note_20101203_Magnet_Synchronization_120612.pdf Internal_Note_20110117_Updated_Lattice_120612.pdf Internal_Note_20111124_Updated_Lattice_120611.pdf Internal_Note_20121107_Updated_Lattice_140129.pdf Internal_Note_20130724_OCO_Modeling_141009.pdf Internal_Note_20150129_MIK_Analysis_150130.pdf Internal_Note_20150930_MW_Threshold.pdf insertion devices Internal_Note_20090922_Insertion_Devices_for_the_MAX_IV_3_GeV_Storage_Ring.pdf Internal_Note_20100215_Insertion_Devices_for_the_MAX_IV_3_GeV_Ring.pdf Internal_Note_20101209_Elliptically_Polarising_Undulators_with_11_mm_Magnetic_Gap_at_the_MAX_IV_3_GeV_Ring.pdf Internal_Note_20111110_Comparison_Brilliance_MAX_IV_NSLS-II.pdf Internal_Note_20111220_Elliptically_polarizing_undulators_for_the_Arpes_beamline_at_the_Solaris_Light_Source.pdf RF cavities Internal_Note_20240410 Harmonic Cavity Parameters for Flat

Sample environments and equipment

…DanMAX). Holder for 6 CR2032 coin cell batteries (w. windows in the steel casing) Holder for mapping flat samples. Holds two 44 mm by 44 mm plates (~0.5-1 mm thick)…

Preparation chamber

…direct sample temperature measurement via a K-type thermocouple (requires a custom sampleplate). The receiver is back-compatible with standard flat ScientaOmicron flag-style sampleplates, however, the vertical dimensions for any double-stage sampleholders…