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User information AFM

…that the machine is placed in Optics Metrology Lab. The lab is a clean, restricted environment where general user admittance is only permitted after clean room training. Please, contact Louisa…

Microscope

…of this image. Right panel: height profile along the indicated line. Comparison between STM and ncAFM imaging/resolution Sample: SiC(0001), STM: Vbias = +1.25 V, It = 230 pA AFM: Vbias…

AFM scanning modes

…thin flexible stripe, usually metal-coated silicon, called a cantilever. The back of the cantilever is illuminated with the laser light, and the reflection is observed on a position-sensitive detector (PSD)….

Atomic Force Microscope

…As with other activities involving the support microscopy labs, the instrument time is given primarily in conjunction with granted beamtime. System overview Dimension 3100 is has been introduced to market…

STM experimental station

…environment around the sample can be allowed. Gas use is restricted and should always be discussed well in advance. AFM measurements may be performed in the non-contact mode only, no…

User information

…to the scanning tunneling microscope or vacuum suitcase is desired, and, in particular, the help of an operator is intended, the users must include a brief description of a planned…

Sample Environments

…compatible with our sample scanner can be used. If a different sample support is needed, contact the beamline staff before proposal submission or well in advance of an approved experiment….

User information

…schedule. The cell is provided with full functionality, however, the cleanliness cannot be guaranteed as it is not baked in between measurements. For information on how to apply for the…

User information

…IV, many proposals could be carried out at either HIPPIE or SPECIES. Such proposals can therefore be submitted with a preference of beamline, which is recommended if a proposal would…