Multiscale structural characterization by scanning SWAXS imaging

Presented by Kim Nygård from MAX IV, Lund University, Lund, Sweden

Here Kim Nygård, scientist at MAX IV’s ForMAX beamline will talk about small- and wide-angle x-ray scattering (SWAXS) in scanning-imaging mode, providing means to locally characterise the nanoscale structure of materials over macroscopic volumes. introduce the technique, provide a few illustrative examples, and discuss challenges for new users of the technique.