Beamlines available for proposals
Bloch
Primary beamline contact: Johan Adell
| Available for | Technique description |
|---|---|
| General Users | High-resolution angle resolved photoelectron spectroscopy (ARPES), using deflection based analyzer or 6-axis manipulator. |
| General Users | Linear vertical or horizontal polarised light from EPU, with energy range 10-1000eV (peak flux and resolution 15-200eV). |
| General Users | Online Scanning tunneling microscopy (STM), 50K - 300K. |
Balder
Primary beamline contact: Konstantin Klementiev and Kajsa Sigfridsson Clauss
| Available for | Technique description |
|---|---|
| General Users | X-ray Absorption Spectroscopy (XANES and EXAFS) in transmission, continuous scanning down to 30 sec/EXAFS |
BioMAX
Primary beamline contact: Uwe Müller
| Available for | Technique description |
|---|---|
| General Users | Data collection at a fixed energy between 6 and 19.5 keV, detector distance between 220 and 800 mm, with apertures of 5, 10, 20 microns (beam size 20x5microns) or 10, 20 or 50 microns (beam size 50 microns) |
| General Users | Automated sample mounting and dismounting from UniPucks |
| General Users | Sample temperature 100 K; room temperature with or without humidity control available for manual mounting only |
| General Users | Non-optimized SAD experiments (above absorption edge) |
| General Users | Automated data integration, scaling and merging. Offline remote access for manual data processsing. |
| General Users | SX experiments using HVE-injector (High viscosity extrusion injector) |
FinEstBeAMS
Primary beamline contact: Antti Kivimäki
| Available for | Technique description |
|---|---|
| General Users | High-resolution photoelectron and Auger electron spectroscopy of gaseous samples. (GPES) |
| General Users | Ion time-of-flight mass spectrometry of gaseous samples. (GPES) |
| General Users | X-Ray Absorption of gaseous samples, measured in the Total Ion Yield mode. (GPES) |
| General Users | Photoluminescence spectroscopy of solid samples in the wavelength range 1.4um-200 nm. (PLES) |
| General Users | Measurement of Photoluminescence excitation functions at fixed emission wavelengths as well as reflection spectra from polished surfaces of solid samples. (PLES) |
| General Users | Temperature dependencies of luminescence properties of solid materials in the temperature range from 10 K up to 350 K. (PLES) |
| General Users | Photoelectron-Photoion Coincidence (PEPICO) spectroscopy of gaseous samples. (GPES) |
HIPPIE
Primary beamline contact: Andrey Shavorskiy
| Available for | Technique description |
|---|---|
| General Users | Catalysis Cell Allows APXPS of a solid-gas interface up to 10 mbar. Used for catalysis and surface science experiments |
| General Users | PM-IRRAS Allows APXPS and FTIR on the same spot up to 1 mbar. Used for catalysis and surface science experiments |
| General Users | Liquid/Electrochemistry Cell Allows APXPS of a solid-liquid (dip-and-pull setup) and gas-liquid (liquid jet setup) interfaces up to 30 mbar for electrochemistry, energy, environmental, and atmospheric science experiments. |
MAXPEEM
Primary beamline contact: Alexei Zakharov
| Available for | Technique description |
|---|---|
| General Users | SPELEEM in the soft X-ray range (only very limited time available during the Sept 2019 - Feb 2020 period) |
NanoMAX
Primary beamline contact: Alexander Björling (forward ptychography), Gerardina Carbone (Bragg geometry), Ulf Johansson (X-Ray Fluorescence)
| Available for | Technique description |
|---|---|
| General Users | Scanning X-ray diffraction and coherent imaging in the Bragg geometry |
| General Users | Forward ptychography and CDI |
| General Users | X-Ray Fluorescence mapping in 2D |
Veritas
Primary beamline contact: Conny Såthe
| Available for | Technique description |
|---|---|
| General Users | User roll-up at the open port branch. Only approved equipment (contact beamline) |