Beamlines available for proposals

Bloch

Primary beamline contact: Johan Adell

Available for	Technique description
General Users	High-resolution angle resolved photoelectron spectroscopy (ARPES), using deflection based analyzer or 6-axis manipulator.
General Users	Linear vertical or horizontal polarised light from EPU, with energy range 10-1000eV (peak flux and resolution 15-200eV).
General Users	Online Scanning tunneling microscopy (STM), 50K - 300K.

Available for	Technique description
General Users	X-ray Absorption Spectroscopy (XANES and EXAFS) in transmission, continuous scanning down to 30 sec/EXAFS
General Users	X-ray Absorption Spectroscopy (XANES and EXAFS) in fluorescence with 7 element SDD, continuous scanning down to 30 sec/EXAFS
Commissioning experts	X-ray Emission Spectroscopy (XES), expert mode with limited angular range (~Cu Kα), contact BL staff for further details.

Primary beamline contact: Uwe Müller

Available for	Technique description
General Users	Data collection at fixed energy between 6 and 19.5 keV, detector distance between 126 and 900 mm, beam focus of 20x5 microns or 50x50 microns and defining aperture of 5, 10, 20 or 50 microns
General Users	Automated sample mounting and dismounting from UniPucks, 29 puck positions in dewar
General Users	Sample temperature 100 K; room temperature with or without humidity control available for manual mounting only
General Users	Non-optimized SAD experiments (above absorption edge)
General Users	Automated data integration, scaling and merging. Offline remote access for manual data processsing.
General Users	SX experiments using HVE-injector (High viscosity extrusion injector), fixed target scan using the MD3
General Users	Element identification by X-ray Fluorescence
General Users	Remote data collection Under development. Please contact beamline manager; training required.

Primary beamline contact: Tomás Plivelic

Available for	Technique description
Commissioning experts

Primary beamline contact: Antti Kivimäki

Available for	Technique description
General Users	High-resolution photoelectron and Auger electron spectroscopy of gaseous samples. (GPES)
General Users	Ion time-of-flight mass spectrometry of gaseous samples. (GPES)
General Users	X-Ray Absorption of gaseous samples, measured in the Total Ion Yield mode. (GPES)
General Users	Photoluminescence spectroscopy of solid samples in the wavelength range 1.4um-200 nm. (PLES)
General Users	Measurement of Photoluminescence excitation functions at fixed emission wavelengths as well as reflection spectra from polished surfaces of solid samples. (PLES)
General Users	Temperature dependencies of luminescence properties of solid materials in the temperature range from 10 K up to 350 K. (PLES)
General Users	Photoelectron-Photoion Coincidence (PEPICO) spectroscopy of gaseous samples. (GPES)
Commissioning experts	X-ray photoelectron spectroscopy of surfaces and interfaces in the UHV. (SSES)
Commissioning experts	Angle-resolved photoelectron spectroscopy of 2D materials and condensed matter physics. (SSES)

Primary beamline contact:

Available for	Technique/facility description
General Users	Beamline: Linear horizontally polarized light from LPU, with energy range 40-1500 eV. Spot on sample both defocused (0.5-1.5 mm) and focused (from 50x15 um to 150x40 um in different end stations).
General Users	Surface- and Material Science (SMS) branch: High-resolution photoelectron spectroscopy (PES) on solid samples using SES-2002 analyzer and 4-axis manipulator; X-ray absorption spectroscopy (XAS or NEXAFS) using total and partial electron yield.
General Users	Low Density Matter (LDM) branch: High-resolution PES on LDM samples using R4000 analyzer with the following sample delivery systems (samples must be approved by chemical safety group): - Liquid jet setup for e.g. aqueous solutions - Molecular jet source (continuous beam) for experiments on cold beams of atomic and molecular gases - Gas cell for PES experiments on atomic and molecular gases

Primary beamline contact: Andrey Shavorskiy

Available for	Technique description
General Users	Catalysis Cell Allows APXPS of a solid-gas interface up to 10 mbar. Used for catalysis and surface science experiments
General Users	PM-IRRAS Allows APXPS and FTIR on the same spot up to 1 mbar. Used for catalysis and surface science experiments
General Users	Liquid/Electrochemistry Cell Allows APXPS of a solid-liquid (dip-and-pull setup) and gas-liquid (liquid jet setup) interfaces up to 30 mbar for electrochemistry, energy, environmental, and atmospheric science experiments.

Primary beamline contact: Alexei Zakharov

Available for	Technique description
General Users	SPELEEM in the soft X-ray range (only very limited time available during the Sept 2019 - Feb 2020 period)

Available for	Technique description
General Users	Scanning X-ray diffraction and coherent imaging in the Bragg geometry
General Users	Forward ptychography and CDI
General Users	X-Ray Fluorescence mapping in 2D
General Users	Forward ptycho-tomography (under development, not all samples are suitable, please contact beamline team to discuss feasibility before proposal submission)

Primary beamline contact:

Available for	Technique description
General users	APXPS using the standard cell Available for APXPS experiments up to 20 mbar. Used for catalysis, oxidation studies, and surface science experiments.
General users	APXPS using the ALD cell Available for in-situ ALD experiments for pressures up to 20 mbar.
General users	RIXS using the GRACE spectrometer. Solid samples only. LN2-sample cooling available, 4-axis manipulator.

Primary beamline contact: Conny Såthe

Available for	Technique description
General Users	User roll-up at the open port branch. Only approved equipment (contact beamline)