All users are strongly encouraged to contact beamline staff and discuss their proposal before submission.



Primary beamline contact: Craig Polley

Available forTechnique description
General UsersHigh-resolution angle resolved photoelectron spectroscopy (ARPES), using deflection based analyzer or 6-axis manipulator.
General UsersLinear vertical or horizontal polarised light from EPU, with energy range 10-1000eV (peak flux and resolution 15-200eV).
General UsersOnline Scanning tunneling microscopy (STM), 50K - 300K.
Commissioning expertsSpin-resolved ARPES with a 3D-VLEED detector



Primary beamline contact: Konstantin Klementiev and Kajsa Sigfridsson Clauss

Available forTechnique description
General UsersX-ray Absorption Spectroscopy (XANES and EXAFS) in transmission, continuous scanning down to 30 sec/EXAFS
General UsersX-ray Absorption Spectroscopy (XANES and EXAFS) in fluorescence with 7 element SDD, continuous scanning down to 30 sec/EXAFS



Primary beamline contact: Ana Gonzalez

Available forTechnique description
General UsersData collection at fixed energy between 6 and 24 keV, detector distance between 126 and 900 mm, beam focus of 20x5 microns, 50x50 microns or 100x100 microns and defining aperture of 5, 10, 20, 50 and 100 microns.
General UsersAutomated sample mounting and dismounting from UniPucks, 29 puck positions in dewar.
General UsersSample temperature 100 K; room temperature with or without humidity control available for manual mounting only.
General UsersSAD and MAD experiments.
General UsersAutomated data integration, scaling and merging. Offline remote access for manual data processsing.
General UsersSerial crystallography experiments using HVE-injector (High viscosity extrusion injector), fixed target scan using the MD3. Please contact beamline manager.
General UsersElement identification by X-ray Fluorescence.
General UsersRemote data collection.
General UsersFragment-based drug screening. Please contact beamline manager.
See also BioMAX User Information



Primary beamline contact: Tomás Plivelic

Available forTechnique description
General UsersSAXS, at 12.4 keV, q-range 1×10-3 to 0.5 Å-1. Contact BL staff for further details and see here.
General UsersLaser triggered, temperature jump time-resolved SAXS (2 ms time-resolution), at 12.4 keV, q-range 1 x 10-3 to 0.5 Å-1 and ca. 1.5 to 2.3 Å-1.
General UsersSolution and Bio-SAXS, with pipetting autoloader from 96 well plates, flow-through quartz capillary, in-line HPLC.
General UsersMultiple capillary, multiple position solid sample holders, with thermostatic water bath; Linkam heating stage with liquid nitrogen cooling pump.



Primary beamline contact: DanMAX contacts

Available forTechnique description
General UsersPowder X-ray diffraction (PXRD) in Debye-Scherrer geometry using 2D area detector in the energy range from 15-35 keV.
General UsersPXRD: Sample spinner in horizontal and vertical geometry. Rotation stage in vertical geometry.
General UsersPXRD: Sample temperature from 90 K to 500 K
General UsersPXRD: With sample environment from DanMAX portfolio - see DanAMX sample environment
General Users2D PXRD and XRF mapping using continuous and step scans.
General UsersTotal scattering, SDD~95mm, E=35 keV, Qmax~20Å^1.
General UsersPXRD: Stand-alone sample user-designed environments. Only pre-approved equipment – contact beamline staff.



Primary beamline contact: Jörgen Larsson

Available forTechnique description
General UsersScattering set-up (SAXS, WAXS) Air or He-environment
General UsersScattering set-up (in vacuum). Limited scattering range +/-10 degrees horisontal 0-40 degrees vertical
Vacuum better than 1E-7 mBar; 2E-6 with Pilatus connected to vacuum;
Cryocooling 40K for grazing incidence samples
Tilt range +/- 0.5 degrees
Wedges available on request to match Bragg angle. No cryocooling with wedges.
General UsersTilt platform 0-15 degrees (wedges available on request)
+/-20 mm translation range
Cryostream for LN2 available (performance untested)
General UsersLife-time measurement by visible fluorescence detection following X-ray excitation



Primary beamline contact: Antti Kivimäki

Available forTechnique description
General UsersHigh-resolution photoelectron and Auger electron spectroscopy of gaseous samples. (GPES)
General UsersIon time-of-flight mass spectrometry of gaseous samples. (GPES)
General UsersX-Ray Absorption of gaseous samples, measured in the Total Ion Yield mode. (GPES)
General UsersPhotoelectron-photoion coincidence (PEPICO) spectroscopy of gaseous samples. (GPES)
General UsersNegative-ion/positive-ion coincidence (NIPICO) spectroscopy of gaseous samples. (GPES)
General UsersMeasurement of photoluminescence emission spectra at fixed excitation energies in the wavelength range 200 nm - 1.1um. (PLES)
General UsersMeasurement of photoluminescence excitation spectra at fixed emission wavelengths in photon energy range 4.55 - 1300 eV. (PLES)
General UsersTime-resolved photoluminescence spectroscopy. (PLES)
General UsersTemperature dependencies of luminescence properties of solid materials in the temperature range from 10 to 350 K. (PLES)
General UsersNear edge X-ray absorption fine structure (NEXAFS), measurement temperature from 100 K (LN2 cooling) to 600 K (resistive heating) (SSES)
General UsersX-ray/UV photoelectron spectroscopy (XPS/UPS), measurement temperature from 100 K (LN2 cooling) to 600 K (resistive heating) (SSES)
General UsersAngle resolved photoelectron spectroscopy (ARPES), measurement temperature from 100 K (LN2 cooling) to 600 K (resistive heating) (SSES)



Primary beamline contact: FlexPES contacts

Available forTechnique/facility description
General UsersBeamline: Linear horizontally polarized light from LPU, with energy range 40-1500 eV. Spot on sample both defocused (0.5-1.5 mm) and focused (from 50x15 um to 150x40 um in different end stations).
General UsersSurface- and Material Science (SMS) branch: High-resolution photoelectron spectroscopy (PES) on solid samples using DA30-L(W) analyzer and 4-axis manipulator; X-ray absorption spectroscopy (XAS or NEXAFS) using total electron yield, partial electron yield and partial fluorescence yield (SDD detector).
General UsersLow Density Matter (LDM) branch: High-resolution PES on LDM samples using R4000 analyzer with the following sample delivery systems (samples must be approved by chemical safety group):
- Liquid jet setup for e.g. aqueous solutions
- Molecular jet source (continuous beam) for experiments on cold beams of atomic and molecular gases
- Gas cell for PES experiments on atomic and molecular gases
- Magnetron-based source for metal particle beams

Commissioning expertsLow Density Matter (LDM) branch:
COLTRIMS/Multi-coincidence spectroscopy in expert commissioning mode (ICE end station); to be used with molecular jet/cluster source.



Primary beamline contact: Kim Nygård

Available forTechnique description
Commissioning expertsFull-field microtomography, without beam-expanding optics based on CRLs.
Commissioning expertsSmall- and/or wide-angle x-ray scattering (SWAXS).
Commissioning expertsScanning SWAXS imaging, without microfocusing optics based on CRLs.
Commissioning expertsCombined full-field microtomography and SWAXS.



Primary beamline contact: Andrey Shavorskiy

Available forTechnique description
General UsersCatalysis Cell

Allows APXPS of a solid-gas interface, typically up to 10 mbar. Used for catalysis and surface science experiments
General UsersPM-IRRAS

Allows APXPS and FTIR on the same spot. Used for catalysis and surface science experiments
General UsersLiquid/Electrochemistry Cell

Allows APXPS of a solid-liquid (dip-and-pull setup) and gas-liquid (liquid jet setup) interfaces up to 30 mbar for electrochemistry, energy, environmental, and atmospheric science experiments.



Primary beamline contact: Alexei Zakharov

Available forTechnique description
General UsersSPELEEM in the soft X-ray range



Primary beamline contact: Thomas Ursby

Available forTechnique description
Commissioning Experts



Primary beamline contact: Alexander Björling (coherence and diffraction), Ulf Johansson (X-Ray Fluorescence)

Available forTechnique description
General UsersScanning X-ray diffraction and coherent imaging in the Bragg geometry
General UsersForward ptychography and CDI
General UsersX-Ray Fluorescence mapping in 2D
General UsersForward ptycho-tomography (under development, not all samples are suitable, please contact beamline team to discuss feasibility before proposal submission)
Commissioning ExpertsZone plate based high-resolution imaging in two or three dimensions
Training & EducationApplications of the above techniques to a model system provided by the applicant



Primary beamline contact: SoftiMAX contacts

Available forTechnique description
General UsersSTXM of thin samples, mounted on Si3N4 windows or TEM grids, at absorption edges between photon energies 275 eV and 1600 eV, with spatial resolution between 20-60 nm, depending on energy range and requirements.



Primary beamline contact: Species contacts

Available forTechnique description
General usersAPXPS using the standard cell

Available for APXPS experiments up to 20 mbar. Used for catalysis, redox studies, and different surface science experiments.
General usersAPXPS using the ALD cell

Available for in-situ and operando ALD experiments for pressures up to 20 mbar.
General usersRIXS using the GRACE spectrometer

Emission energy range 50-650 eV, only linear polarization horizontally and vertically. Solid samples only. LN2-sample cooling available, 4-axis manipulator.



Primary beamline contact: Nikolay Vinogradov

Available forTechnique description
General Users, preferably in combination with a beamline proposal in research area spectroscopyScanning Tunneling Microscopy/Spectroscopy (STM/STS), dynamic STM with QPlus sensor, UHV. W or Pt/Ir(STM only) probes
General Users, preferably in combination with a beamline proposal in research area spectroscopyNon-contact Atomic Force Microscopy (NC-AFM) with QPlus sensor, force curves, UHV
General Users, preferably in combination with a beamline proposal in research area spectroscopy"Conventional" Atomic Force Microscopy (AFM) contact/tappng mode, in air
General Users, preferably in combination with a beamline proposal in research area spectroscopyScanning Electron Microscopy (SEM) at NanoMAX beamline



Primary beamline contact: Conny Såthe

Available forTechnique description
General UsersVeritas A (Mid range performance RIXS, solid samples, LN2 cooled samples, linear polarization (horizontal and vertical), XAS (MCP and photo diode)), sample scanning
General UsersVeritas B (Open port), contact beamline for specific information