Spectroscopy lets you measure how a material responds when it is illuminated with different wavelengths of light – how it absorbs or emits electromagnetic radiation.  

By penetrating your material with light, you can study its physical properties such as mass, composition and temperature, and see where the components in matter are positioned in relation to each other. This can help you identify the chemical composition of an examined sample and give you information on the local electronic and geometrical information. 

Spectoscopy can also be used to identify trace substances in samples, for example in plant samples to study what impact something has on the environment, or how metals are taken up by other tissue. It can also reveal how atoms and molecules interact on a catalytically active surface, and give you new ideas for how to develop more effective catalytic converters in exhaust emission control systems.  

Spectroscopy techniques offered at MAX IV: 

X-ray Absorption Spectroscopy (XAS) X-ray Photoelectron Spectroscopy (XPS)  Ambient pressure X-ray photoelectron spectroscopy (APXPS) 
Angle Resolved Photoelectron Spectroscopy (ARPES) X-ray Fluorescence (XRF) Resonant Inelastic X-ray Scattering (RIXS) 

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X-ray Absorption Spectroscopy (XAS) 

Used for understanding electronic properties and local and geometric information of materials, including both liquids, gases, and solids. 

Offered at: 

Balder 

SPECIES 

Veritas 

MAXPEEM 

FlexPES 

[Links to the corresponding main beamline pages] 

X-ray Photoelectron Spectroscopy (XPS) 

Used for studying the structure of your material and how it interacts with its environment, so that you can adjust it and improve its performance. You can study its electronic properties, chemical speciation, etc. 

Offered at: 

SPECIES 

HIPPIE 

FlexPES 

[Links to the corresponding main beamline pages] 

Ambient pressure X-ray photoelectron spectroscopy (APXPS) 

Used for studying the chemical and physical processes involved in the interactions between a solid surface and its environment, to better understand corrosion processes, surface catalysis, etc. 

Offered at: 

SPECIES 

HIPPIE 

[Links to the corresponding main beamline pages] 

Angle Resolved Photoelectron Spectroscopy (ARPES) 

Used for studying the electronic structure of surfaces and materials and to map the dispersion of electronic bands near the Fermi level.  

Offered at: 

HIPPIE 

Bloch 

[Links to the corresponding main beamline pages] 

X-ray Fluorescence Spectroscopy (XRF) 

Used for studying the elemental composition of your material and its inter-element correlation, such as tracking the accumulation of nutrition during food processing, or studying a drug’s effects on tissue samples. 

Offered at: 

Balder 

NanoMAX 

SoftiMAX 

[Links to the corresponding main beamline pages] 

Resonant Inelastic X-ray Scattering (RIXS) 

A combination of X-ray Emission Spectroscopy and X-ray Absorption Spectroscopy, used for scanning incident and emitted energies and the difference between them. Lets you study fundamental excitations in correlated materials in detail, and resolve individual vibrational excitations in molecular systems. 

Offered at: 

SPECIES 

Veritas 

[Links to the corresponding main beamline pages] 

  

  

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