The AFM is located in the X-ray Optics Laboratory, part of our Stability, Alignment and Metrology (SAM) division. The schematics below shows the location of the SAM hutch

 

 

The microscope is Veeco/Digital Instruments (now Bruker) Dimension 3100.

 

It clears a field of view of max 90×90 micrometers with max 5 micrometer total height difference. The lateral resolution for 90 micrometer FOV is better than 50 nm, for 10 micrometer scan – better than 2 nm.

The sample size must be below 20 cm (8″) diameter and 2 cm height.

We provide cantilevers for user experiments, however, users are welcome to bring their own cantilevers for tapping or contact modes.