Scanning Tunneling Microscopy

STM, nc-AFM with atomic resolution (Omicron VT XA), experiments in UHV, atomically-clean surfaces


Atomic Force Microscopy

"Conventional" AFM, ambient environment, cleanroom, only topography measurements (Dimension 3100)


Scanning Electron Microscopy

SEM (FlexSEM 1000 ii) at NanoMAX beamline

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