STM-2

Scanning Tunneling Microscopy

STM, nc-AFM with atomic resolution (Omicron VT XA), experiments in UHV, atomically-clean surfaces

AFM_tile

Atomic Force Microscopy

"Conventional" AFM, ambient environment, cleanroom, only topography measurements (Dimension 3100)

SEM-2-tile

Scanning Electron Microscopy

SEM (FlexSEM 1000 ii) at NanoMAX beamline

This page collects the microscopy resources available to the users of MAX IV Laboratory.
Click on the relevant tile to get more information.

 

Techniques available through open call

Available forTechnique description
General Users, preferably in combination with a beamline proposal in research area spectroscopyScanning Tunneling Microscopy/Spectroscopy (STM/STS), dynamic STM with QPlus sensor, UHV. W or Pt/Ir(STM only) probes
General Users, preferably in combination with a beamline proposal in research area spectroscopyNon-contact Atomic Force Microscopy (NC-AFM) with QPlus sensor, force curves, UHV
General Users, preferably in combination with a beamline proposal in research area spectroscopy"Conventional" Atomic Force Microscopy (AFM) contact/tappng mode, in air
General Users, preferably in combination with a beamline proposal in research area spectroscopyScanning Electron Microscopy (SEM) at NanoMAX beamline with Energy-dispersive X-ray (EDX) spectroscopy.

If you are interested in doing microscopy at MAX IV Laboratory, we’d be grateful if you could fill in this short questionnaire to help us develop!