NanoMAX Diffraction Instrument Overview
Photon Energy6-28 keVRoutine operation 8-15 keV
Focal Spot50 - 200 nm
98 nm @ 8 keV
62 nm @ 14 keV
Diffraction limited spot, the spot size is energy dependent. See
Focused beam divergenceApprox. 1.2 mradEnergy independent.
Coherent FluxFully coherent beam:
6x1010 @ 8keV
3x1010 @ 10keV
8x109 @ 14keV

Flux at the sample position. Depends on energy, see Beamline Optics and
2-circle GoniometerTheta:
stroke [-5, 90] deg
resolution: 10-4 deg

stroke [-180, 180] deg
resolution: 10-4 deg
Theta is horizontal and perpendicular to the X-ray beam. Phi is perpendicular to Theta and vertical for Theta=0.

Note that the goniometer does not provide tomographic capabilities.
Coarse sample scanner (XYZ)stroke: 20 mm
resolution: 100 nm
In-house development
Fine sample scanner (XYZ)Option 1 (standard):
100 μm stroke in all directions

Option 2:
200 μm stroke in each horizontal direction
100 μm vertical stroke
This option provides the stiffest frame and the highest resolution

Accessible spaceApprox. 50 mm working space upstream of the X-ray focus.Always contact the beamline staff to discuss non-standard sample holders or environments.
Continuous scanningA single fine axis (X, Y, or Z) can be scanned continuously for fast mapping in 2D.
Sample MicroscopesOn Axis and Top Microscopes
Max res: 5 μm
Max Field of view:
0.3 - 4 mm
X-Ray FluorescenceRaySpec single-element SDD

3-element Ge detector

both coupled with an XSPRESS3 pulse processor
In-line DetectorsEiger2 X 4M
2968 x 2162 pixels2
75 μm pixel size

Pilatus 100K
487 x195 pixels2
172 μm pixel size

Pilatus 1M
981 x 1043 pixels2
172 μm pixel size

High-resolution Crytur camera
2048 x 2048 pixels2
600 nm effective pixel size

Not fully commissioned, please contact beamline staff before proposing to use the Crytur camera!
DiffractionMerlin Si Quad
512 x 512 pixels2
55 μm pixel size
Mounted on the detector robot.
Detector robotPositions the detector in a spherical coordinate system with polar and azimuthal angles approx. [-5, 90] degrees, and radius approx. [200, 1000] mm.
Other integrated equipmentKeysight B2985A electrometer
SRS EC301 potentiostat
Alemnis Nanoindenter
Energy scanningManual energy changes are possible on a timescale of minutes. Image stacks can be collected as functions of energy, but XANES and EXAFS measurements are not possible.
Off-line microscopyTwo optical microscopes are available for off-line sample inspection. One is a high resolution microscope (Olympus BX53M), the other a long distance stereo microscope (Olympus SZX16).

A Hitachi SU1000 electron microscope is also available at the beamline.
NanoMAX second experimental hutch overview
Hutch overview