NanoMAX currently accepts proposals for the KB diffraction station. The planned FZP station, still in the design phase, is not yet available. New instruments and measurement capabilities are being developed at NanoMAX and will become available to users in an incremental way. Capabilities currently available to users are shown below:

FeatureInfoComments
Photon Energy6-20 keVRoutine operation 8-15 keV
Focal Spot50 - 200 nm
Measured:
98 nm @ 8 keV
62 nm @ 14 keV
Diffraction limited spot, the spot size is energy dependent.
Focused beam divergenceApprox. 1.2 mradEnergy independent.
Coherent FluxApprox. 1010 ph/sec
Measured:
1.7x1010 @ 8keV
1.5x1010 @ 10keV
Flux at the sample position. Depends on energy.
2-circle GoniometerTheta:
stroke [-5, 90] deg
resolution: 10-4 deg

Phi:
stroke [-180, 180] deg
resolution: 10-4 deg
Theta is horizontal and perpendicular to the X-ray beam. Phi is perpendicular to Theta and vertical for Theta=0.

Note that the goniometer does not provide tomographic capabilities.
Sample ScannerXYZ coarse
stroke: 25 mm (open loop)
repeatability: 5 μm

XYZ fine
stroke: 100 μm
resolution: 10 nm
Note that the fine piezo scanner limits the weight of sample environments to 100 g.
Accessible spaceApprox. 50 mm working space upstream of the X-ray focus.Always contact the beamline staff to discuss non-standard sample holders or environments.
Continuous scanningA single fine axis (X, Y, or Z) can be scanned continuously for fast mapping in 2D.
Sample MicroscopesOn Axis and Top Microscopes
Max res: 5 μm
Max Field of view:
0.3 - 4 mm
X-Ray FluorescenceAMPTEK single-element SDD

3-element Ge detector

both coupled with an XSPRESS3 pulse processor
In-line DetectorsPilatus 100K
487 x195 pixels2
172 μm pixel size

Pilatus 1M
981 x 1043 pixels2
172 μm pixel size
DiffractionMerlin Si Quad
512 x 512 pixels2
55 μm pixel size
Mounted on the detector robot.
Detector robotPositions the detector in a spherical coordinate system with polar and azimuthal angles approx. [-5, 90] degrees, and radius approx. [200, 1000] mm.
Off-line microscopyTwo optical microscopes are available for off-line sample inspection. One is a high resolution microscope (Olympus BX53M), the other a long distance stereo microscope (Olympus SZX16).

A Hitachi SU1000 electron microscope is also available at the beamline.

Sample environment

Samples are mounted in air at room temperature. For measurements in the reflection geometry, standard SEM specimen holders (12.7 mm diameter with 3.2 mm pins) are provided. Our standard supports for transmission geometry measurements (type A and B) are shown below. Any other sample support that is compatible with our sample scanner can be used. If a different sample support is needed, contact the beamline staff before proposal submission or well in advance of an approved experiment.

Light and compact sample environments may be accommodated if it is provided by the user group and agreed with the beamline staff. An example is shown below. For a successful application, contact the beamline staff to discuss feasibility before submitting a proposal.

Standard sample support pin type A.
Standard sample support pin type B.
KB mirror cage, goniometer, and microscopes.
Standard sample environment, with the support pins mounted on the 3-axis scanners.
Example of a custom sample environment. This light and compact cell allows coherent Bragg imaging under electrochemical conditions.