R. Akan, T. Frisk, F. Lundberg, H. Ohlin, U. Johansson, K. Li, A. Sakdinawat, and U. Vogt
Metal-Assisted Chemical Etching and Electroless Deposition for Fabrication of Hard X-ray Pd/Si Zone Plates
Micromachines 2020, 11(3), 301; https://doi.org/10.3390/mi11030301

A. Björling, S. Kalbfleisch, M. Kahnt, S. Sala, K. Parfeniukas, U. Vogt, D. Carbone, and U. Johansson
Ptychographic characterization of a coherent nanofocused X-ray beam
Opt. Express 28 (2020) 5069; doi: 10.1364/OE.386068

A. Björling, D. Carbone, F. J. Sarabia, S. Hammarberg, J. M. Feliu and J. Solla-Gullón
Coherent Bragg imaging of 60 nm Au nanoparticles under electrochemical control at the NanoMAX beamline
J. Synchrotron Rad. 26 (2019) 1830; doi: 10.1107/S1600577519010385

L. Chayanun, S. Hammarberg, H. Dierks, G. Otnes, A. Björling, M. T. Borgström, and J. Wallentin
Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline
Crystals 2019, 9(8), 432; doi: 10.3390/cryst9080432

M. Osterhoff, A.-L. Robisch, J. Soltau, M. Eckermann, S. Kalbfleisch, D. Carbone, U. Johansson and T. Salditt
Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system
J. Synchrotron Rad. (2019). 26, 1173-1180: doi: 10.1107/S1600577519003886

U. Johansson, D. Carbone, S. Kalbfleisch, A. Björling, A. Rodriguez-Frenandez, T. Stankevic, M. Liebi, B. Bring, A. Mikkelsen, and U. Vogt
Initial Operation of the NanoMAX Beamline at MAX IV
Microsc. Microanal. 24 (Suppl 2), 250-251, 2018; doi:10.1017/S1431927618013600

U. Vogt, K. Parfeniukas, T. Stankevic, S. Kalbfleisch, M.Liebi, Z. Matej, A. Björling, G. Carbone, A. Mikkelsen, and U. Johansson
First x-ray nanoimaging experiments at NanoMAX
Proceedings Volume 10389, X-Ray Nanoimaging: Instruments and Methods III; 103890K (2017); doi: 10.1117/12.2272960
SPIE Optical Engineering + Applications, 2017, San Diego, California, United States

P. Kristiansen, U. Johansson, T. Ursby, and B. N. Jensen
Vibrational performance of a cryocooled Horizontal DCM
J. Synchrotron Rad., 2016. 23, 1076–1081;  doi.org:10.1107/S1600577516009243

U. Johansson, U. Vogt, A. Mikkelsen
NanoMAX: a hard x-ray nanoprobe beamline at MAX IV
Proceedings Volume 8851, X-Ray Nanoimaging: Instruments and Methods, 88510L (2013); doi: 10.1117/12.2026609
SPIE Optical Engineering + Applications, 2013, San Diego, California, United States