Information valid for the user call October 2018 – June 2019. CLOSED

NanoMAX is open for proposals for next users call, which covers the period October 2018 to June 2019.
We accept proposals that will make use of the KB diffraction station.
The FZP station, still in design phase, is not part of this call.

The beamline is still in the project phase, and commissioning activities are performed in parallel with User Operation for the period covered by this User Call. Therefore, technical capabilities and methods will be available to users in an incremental way. The instruments and measurement capabilities offered to users or still in development are shown below in the list:

Technical / MethodInfoStatusComments
Photon Energy7--30 keVAvailableRoutine operations 8--15 keV
Focal Spot50 - 200 nm
98 nm @ 8 keV
62 nm @ 14 keV
Diffraction limited spot
Coherent Flux109 - 1010 ph/secAvailableDepending on energy
2-circles GoniometerTheta:
stroke [-5, 90] deg
resolution: 10-4 deg

stroke [-180, 180] deg
resolution: 10-4 deg
Sample SupportXYZ Coarse
stroke: 20 mm (open loop)
repeatability: 5 μm

XYZ fine
stroke: 100 μm
resolution: 10 nm

Continuous scan


Available with
some restrictions
A new sample support with
encoded translation and tilts is
in design phase.
Might become available early
2019 for first tests with users.

Contact BL staff for more details
Sample MicroscopesBoth On Axis and Top Microscopes
Max res: 5 μm
Max Field of view:
0.3 - 4 mm
X-Ray FluorescenceAMPTEK Si‐Dri coupled with XSPRESS3

3-elements Ge detector

In commissioning
2D maps at fixed angular position

Might become available Winter 2018
Far Field PtychographyPilatus 100K.
487 x 195 pixels2
-172 μm square pixels

Eiger 1M
1030 x 1065 pixels2
-75 μm square pixels

In commissioning
Online Reconstruction algorithms available

Might become available Winter 2018
DiffractionMerlin Si Quad.
512 x 512 pixels2
-55 μm square pixels

Detector Robot:
Gamma =[-10, 90] deg
Delta = [-10, 90] deg
Radius = [150, 1000] mm

HKL mode
In commissioning

Robot controlled
remotely with
separate control system.

Not available
Available from October 2018

Detector can be positioned at
desired values but not included
in scans. Including Robot in Scans foreseen in 2019

Future development
XANESStack of XRF maps at discrete incident energies Under development. Contact BL staff for details

More useful information:

  • Samples are mounted in air. Our standard support is shown in the image below, however, any other sample supports that is compatible with our sample scanner can be used. Users are strongly advised to contact beamline staff if a different support is needed.
  • Light and compact sample environments may be accommodated if it is provided by the user group and agreed with the beamline staff. It is strongly advised to contact the beamline staff to discuss possibilities before submitting application.
  • Off-line optical microscopes are available for sample inspection. High resolution microscope (Olympus BX53M) and long distance stereo microscope (Olympus SZX16).
  • Note: the goniometer is not designed to provide tomography capabilities. 2D-scanning in transmission at fixed sample azimuth are possible. 2D-scanning at different Bragg angles is also possible both in horizontal and vertical scattering geometry. As of March 2018 the Robot positions are not included in the data-file and must be logged externally.


Sample pin type A for the CXDI experimental station