At the Diffraction Station, samples are mounted in air and at room temperature. For measurements in the reflection geometry, standard SEM specimen holders (12.7 mm diameter with 3.2 mm pins) are provided. Our standard supports for transmission geometry measurements (type A and B) are shown below. Any other sample support that is compatible with our sample scanner can be used. If a different sample support is needed, contact the beamline staff before proposal submission or well in advance of an approved experiment.
Light and compact sample environments may be accommodated if it is provided by the user group and agreed with the beamline staff. An example is shown below. For a successful application, contact the beamline staff to discuss feasibility before submitting a proposal.
Example of a custom sample environment. This sample heater allows studying temperature-dependent phase transitions.