A ScientaOmicron VT-STM XA is UHV coupled to the A-branch endstation, and is available to users either during their beamtime, or afterwards subject to the availability of staff to take the measurements. The instrument is routinely capable of atomic resolution imaging, even when the adjacent preparation or ARPES chambers are in use. In the right circumstances it can offer a powerful complement to an ARPES experiment.
Please note that the VT-XA does not cool the tip, so the instrument will not achieve the stability or energy resolution of an LT-STM instrument.
- Lattice size measurements to within <=1%
- Identifying when multiple domains are contributing to the photoemission spectra
- Verifying a successful sample preparation when LEED or ARPES is not sufficient
- STS and dIdV measurements when ≈120meV energy resolution is acceptable
|Coarse positioning range (x/y/z)||10 x 10 x 10mm|
|Fine scan range (x/y/z)||12 x 12 x 1.5μm|
|Maximum sample temperature||500K|
|Minimum sample temperature (LHe)||50K|
|Minimum sample temperature (LN2)||113K|
|Arbitrary temperature stabilization?||Yes|
These measurements were taken at room temperature on 7×7 reconstructed Si(111).