Surface & Material Science branch

…transfer (p = 2⋅10-6mbar); 2 hours + LN2 trap to reach ultimate base pressure Analyzer Type Scienta DA30-L(W) (a version of DA30-L with extended Ekin range in deflection and angular…

A-branch measurement chamber

…a DA30-L from ScientaOmicron. This is capable of an angular resolution <0.1° (0.12° demonstrated) and energy resolution <2meV (5meV demonstrated, noise reduction efforts ongoing). Notably, this analyzer is capable of electronic deflection…

Bloch

…arbitrary sample temperatures down to 18K. The electron analyzer is a high-performance DA30 hemispherical analyzer from ScientaOmicron. Here the electronic deflection mode enables Fermi surface mapping without needing to rotate…