User information AFM
Getting access The access to the AFM infrastructure is granted primarily in conjunction with beamtime at MAX IV Laboratory. It is important that the users mention the AFM (or other…
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Microscope
…Comparison between STM and ncAFM imaging/resolution Sample: SiC(0001), STM: Vbias = +1.25 V, It = 230 pA AFM: Vbias = 0.00 V, df = -20.1 Hz (f = 28.04 kHz)…
AFM scanning modes
The Atomic Force Microscopy relies on scanning a very sharp tip across a surface of interest at a very close proximity or even touching it. The tip “sits” on a…
Support labs
Atomic Force Microscope
AFM at X-ray Optics Lab It is possible now for MAX IV users to characterize their samples with true Atomic Force Microscopy, using the Dimension 3100 machine from Veeco/Digital Instruments….
STM experimental station
…characterization with LEED and Auger spectroscopy. A dedicated gas line allows for controllable introduction of ultra-pure gases, and ports are available for mounting own effusion cells / sources, etc… The…
User information
…to the scanning tunneling microscope or vacuum suitcase is desired, and, in particular, the help of an operator is intended, the users must include a brief description of a planned…
Sample Environments
…in transmission geometry as well as simultaneous XRF measurements. device from DTU Energy and DTU Nanolab In this example a small AFM / STM setup was mounted on top of…
User information
…for both beamlines. At SPECIES the APXPS endstation offers to users: Standard ambient pressure cell for catalysis, redox chemistry, etc. research. Maximum pressure about 20 mbar, maximum temperature about 600…
User information
Photon energy 260 eV – 2500 eV (maximum range) 260 eV – 2000 eV at > 1012 ph/s Resolving power Up to 35000 Spot size 60 µm (h) x 25…