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User information AFM

…is no remote access to the AFM instrument that can be granted to general users. The users with experience in AFM may be granted the permission to run the instrument…

Microscope

…deposition is possible Approx distance flange-sample ~ 160 mm at 40o incidence Storage Carousel with 12* sample slots Table with main parameters of the analysis chamber. *Actual number of available…

AFM scanning modes

…thin flexible stripe, usually metal-coated silicon, called a cantilever. The back of the cantilever is illuminated with the laser light, and the reflection is observed on a position-sensitive detector (PSD)….

Atomic Force Microscope

…As with other activities involving the support microscopy labs, the instrument time is given primarily in conjunction with granted beamtime. System overview Dimension 3100 is has been introduced to market…

STM experimental station

…environment around the sample can be allowed. Gas use is restricted and should always be discussed well in advance. AFM measurements may be performed in the non-contact mode only, no…

User information

…to the scanning tunneling microscope or vacuum suitcase is desired, and, in particular, the help of an operator is intended, the users must include a brief description of a planned…

Sample Environments

…fluorescence measurements (less background from the holder). User Provided Sample Environments As mentioned above, light and compact sample environments may be accommodated if it they are provided by the user…

User information

…only the standard ambient pressure cell or only UHV measurements are offered for this type of access, and only during certain pre-defined time. Please contact beamline personnel for the current…

User information

…The HIPPIE beamline offers a new type of access – Fast Access – to allow short-notice proposals for short experiments. This type of access can be used for both feasibility…