User information AFM
Getting access The access to the AFM infrastructure is granted primarily in conjunction with beamtime at MAX IV Laboratory. It is important that the users mention the AFM (or other…
Getting access The access to the AFM infrastructure is granted primarily in conjunction with beamtime at MAX IV Laboratory. It is important that the users mention the AFM (or other…
…of this image. Right panel: height profile along the indicated line. Comparison between STM and ncAFM imaging/resolution Sample: SiC(0001), STM: Vbias = +1.25 V, It = 230 pA AFM: Vbias…
…thin flexible stripe, usually metal-coated silicon, called a cantilever. The back of the cantilever is illuminated with the laser light, and the reflection is observed on a position-sensitive detector (PSD)….
…As with other activities involving the support microscopy labs, the instrument time is given primarily in conjunction with granted beamtime. System overview Dimension 3100 is has been introduced to market…
…environment around the sample can be allowed. Gas use is restricted and should always be discussed well in advance. AFM measurements may be performed in the non-contact mode only, no…
…to the scanning tunneling microscope or vacuum suitcase is desired, and, in particular, the help of an operator is intended, the users must include a brief description of a planned…
…fluorescence measurements (less background from the holder). User Provided Sample Environments As mentioned above, light and compact sample environments may be accommodated if it they are provided by the user…
…fast access, please visit Fast Access call page Fast access time slots are available upon request. Please contact the beamline staff. Deadline for submissions: At least 3 weeks before the desired…
…how to apply for the fast access, please visit https://www.maxiv.lu.se/user-access/access-modes/fast-access/ Scanning probe microscopy If your experiment would benefit from UHV scanning probe microscopy (STM or NC-AFM) of your surfaces, samples from…