User information AFM

…is no remote access to the AFM instrument that can be granted to general users. The users with experience in AFM may be granted the permission to run the instrument…

Microscope

…dF/dZ mapping Table with main parameters of the microscope. ** Due to poor control over the tip shape at room temperature, the performance of all ncAFM techniques is not guaranteed.

AFM scanning modes

…thin flexible stripe, usually metal-coated silicon, called a cantilever. The back of the cantilever is illuminated with the laser light, and the reflection is observed on a position-sensitive detector (PSD)….

Atomic Force Microscope

AFM at X-ray Optics Lab It is possible now for MAX IV users to characterize their samples with true Atomic Force Microscopy, using the Dimension 3100 machine from Veeco/Digital Instruments….

STM experimental station

…environment around the sample can be allowed. Gas use is restricted and should always be discussed well in advance. AFM measurements may be performed in the non-contact mode only, no…

User information

…to the scanning tunneling microscope or vacuum suitcase is desired, and, in particular, the help of an operator is intended, the users must include a brief description of a planned

Sample Environments

…fluorescence measurements (less background from the holder). User Provided Sample Environments As mentioned above, light and compact sample environments may be accommodated if it they are provided by the user…

User information

…only the standard ambient pressure cell or only UHV measurements are offered for this type of access, and only during certain pre-defined time. Please contact beamline personnel for the current…

User information

…IV, many proposals could be carried out at either HIPPIE or SPECIES. Such proposals can therefore be submitted with a preference of beamline, which is recommended if a proposal would…